Electronic Components, Technology and Materials
Department of Microelectronics

dr. F. Vitale

PhD student
Electronic Components, Technology and Materials (ECTM), Department of Microelectronics

PhD thesis (Mar 2014): High-frequency noise modeling of Si(Ge) bipolar transistors
Promotor: A.W. Heemink, Ramses van der Toorn

Expertise: MEXTRAM model for SiGe HB

Biography

Francesco Vitale was born in S.Pietro Vernotico, Italy in 1983. He received the Bachelor (cum laude) and the Master (cum laude) degree from University of Naples "Federico II"?, respectively in 2006 and 2009. He was with the National Nanotechnology Laboratory of Lecce, Italy from March 2008 to January 2009, working on his master thesis: the topic was the fabrication and the characterization of the AlGaN/GaN HEMTs. Since March 2009 he is with Delft University of Technology, the Netherlands, working on MEXTRAM model for SiGe HBT.

Publications

  1. Impact of the emitter stored charge on RF noise of junction bipolar transistors
    F. Vitale; R. van der Toorn;
    In Proc. 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM 2012),
    Portland, Oregon, USA, pp. 1-4, Sept. 2012. ISBN 978-1-4673-3020-6; DOI 10.1109/BCTM.2012.6352625.

  2. Compact noise modeling of SiGe heterojunction bipolar transistors: Relevance of base-collector shot noise correlation and non-quasi static effects in the quasi-neutral emitter
    F. Vitale; R. Pijper; R. van der Toorn;
    In Proc. 2011 IEEE Bipolar/BiCMOS Technology and Circuits Meeting (BCTM 2011),
    Atlanta, GA, pp. 179-182, Oct. 2011.

  3. A Verilog-A Implementation for Correlated Noise in HBTs
    F. Vitale; Ramses van der Toorn;
    In Proceedings of SAFE 2010,
    Veldhoven, Netherlands, pp. 180-183, Nov. 2010.

  4. Base Resistance Distribution in Bipolar Transistors: Relevance to Compact Noise Modeling and Extraction from Admittance Parameters
    F. Vitale; R. Pijper; Ramses van der Toorn;
    In Proceedings of IEEE BCTM 2010,
    Austin, TX, pp. 161-164, Oct. 2010.

  5. Matlab toolkit for semiconductor device characterization and model.
    Vidal; D; Vitale; F; R. van der Toorn;
    In P.J. French (Ed.), Proc. 12th Annual Workshop on Semiconductor Advances for Future,
    Veldhoven, The Netherlands, STW, pp. 174-177, 2009. ISBN 978-90-73461-62-8.

BibTeX support

Last updated: 1 Mar 2016

Francesco Vitale

Alumnus