MSc Romina Sattari
PhD student
Electronic Components, Technology and Materials (ECTM), Department of Microelectronics
Electronic Components, Technology and Materials (ECTM), Department of Microelectronics
Expertise: Electronic Components, Microelectronics, Thermomechanical Reliability Test chip, Process Integration Fabrication, Power SiP
Themes: Micro/Nano System Integration and ReliabilityBiography
Romina was born in Tehran, Iran in 1993. She received the B.Sc. and M.Sc. degrees in Electrical Engineering from Sharif University of Technology, Tehran, Iran, in 2015 and 2017, respectively. She worked on Indoor Positioning Systems as her thesis work. In 2019, she joined the Electronic Components, Technology, and Materials (ECTM) group at TU Delft, where she is now working as a Ph.D. candidate. Her main research topics are the design and fabrication of a fully thermomechanical reliability test chip, power SiP, and optogenetic system engineering.
Publications
- Transient thermal measurement on nano-metallic sintered die-attach joints using a thermal test chip
R. Sattari; Dong Hu; Xu Liu; H. van Zeijl; S. Vollebregt; GuoQi Zhang;
Applied Thermal Engineering,
Volume 221, pp. 119503, 2023. DOI: 10.1016/j.applthermaleng.2022.119503 - Manufacturing of an In-Package Relative Humidity Sensor for Epoxy Molding Compound Packages
Romina Sattari; Henk van Zeijl; GuoQi Zhang;
In 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
2023. DOI: 10.1109/EuroSimE56861.2023.10100771 - A Thin-Film Reconfigurable SiC Thermal Test Chip for Reliability Monitoring in Harsh Environments
Romina Sattari; Henk van Zeijl; GuoQi Zhang;
In Proc. of Electronic Components and Technology Conference (ECTC),
2023. - In-situ reliability monitoring of power packages using a Thermal Test Chip
H. A. Martin; R. Sattari; E. C. P. Smits; H. W. van Zeijl; W. D. van Driel; GuoQi Zhang;
In 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
2022. DOI: 10.1109/EuroSimE54907.2022.9758913 - Design and Fabrication of a Multi-Functional Programmable Thermal Test Chip
R. Sattari; H. van Zeijl; GuoQi Zhang;
In 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC),
2021. DOI: 10.23919/EMPC53418.2021.9584984
BibTeX support
Last updated: 14 Oct 2024
Romina Sattari
- +31 15 27 8
- [email protected]
- Room: LB 01.640
- List of publications
MSc students
Alumni
- Letian Zhang (2023)